Evolution study of the ElectroMagnetic Interference for RF LDMOS in series chopper application after thermal accelerated tests

M. A. Belaïd, H. Kaouach, Jaleleddine Ben Hadj Slama. Evolution study of the ElectroMagnetic Interference for RF LDMOS in series chopper application after thermal accelerated tests. Microelectronics Reliability, 64:93-97, 2016. [doi]

Abstract

Abstract is missing.