Peterson Adriano Belan, Robson A. G. de Macedo, Sidnei Alves de Araújo. Computer Vision Approaches to Detect Bean Defects. In Ingela Nyström, Yanio Hernández Heredia, Vladimir Milián Núñez, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 24th Iberoamerican Congress, CIARP 2019, Havana, Cuba, October 28-31, 2019, Proceedings. Volume 11896 of Lecture Notes in Computer Science, pages 336-345, Springer, 2019. [doi]
Abstract is missing.