A multilayered ceramic (MLC) interface design for 125+MHz performance wafer probing [of SRAMs]

George M. Belansek, Peter Loomis, Fred J. Towler, Charles Warner, Donald Wheeler. A multilayered ceramic (MLC) interface design for 125+MHz performance wafer probing [of SRAMs]. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 118-122, IEEE, 1991. [doi]

Authors

George M. Belansek

This author has not been identified. Look up 'George M. Belansek' in Google

Peter Loomis

This author has not been identified. Look up 'Peter Loomis' in Google

Fred J. Towler

This author has not been identified. Look up 'Fred J. Towler' in Google

Charles Warner

This author has not been identified. Look up 'Charles Warner' in Google

Donald Wheeler

This author has not been identified. Look up 'Donald Wheeler' in Google