George M. Belansek, Peter Loomis, Fred J. Towler, Charles Warner, Donald Wheeler. A multilayered ceramic (MLC) interface design for 125+MHz performance wafer probing [of SRAMs]. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 118-122, IEEE, 1991. [doi]
Abstract is missing.