Yasmina Belaroussi, Abdelhalim Slimane, Mohand-Tahar Belaroussi, Mohamed Trabelsi, Gilles Scheen, Khaled Ben Ali, Jean-Pierre Raskin. RF and non-linearity characterization of porous silicon layer for RF-ICs. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 79-82, IEEE, 2014. [doi]
@inproceedings{BelaroussiSBTSA14,
title = {RF and non-linearity characterization of porous silicon layer for RF-ICs},
author = {Yasmina Belaroussi and Abdelhalim Slimane and Mohand-Tahar Belaroussi and Mohamed Trabelsi and Gilles Scheen and Khaled Ben Ali and Jean-Pierre Raskin},
year = {2014},
doi = {10.1109/IDT.2014.7038591},
url = {http://doi.ieeecomputersociety.org/10.1109/IDT.2014.7038591},
researchr = {https://researchr.org/publication/BelaroussiSBTSA14},
cites = {0},
citedby = {0},
pages = {79-82},
booktitle = {9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014},
publisher = {IEEE},
isbn = {978-1-4799-8200-4},
}