Daniel Belega, Dario Petri, Dominique Dallet. Sine-fitting by the energy-based method in the dynamic testing of ADCs. In IEEE 6th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, IDAACS 2011, Prague, Czech Republic, September 15-17, 2011, Volume 1. pages 33-38, IEEE, 2011. [doi]
Abstract is missing.