AFM image based pattern detection for adaptive drift compensation and positioning at the nanometer scale - researchr publication authors

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Sergey Belikov, Jian Shi, Chanmin Su. AFM image based pattern detection for adaptive drift compensation and positioning at the nanometer scale. In American Control Conference, ACC 2008, Seattle, WA, USA, 11-13 June 2008. pages 2046-2051, IEEE, 2008. [doi]

This author has not been identified. Look up 'Sergey Belikov' in GoogleThis author has not been identified. Look up 'Jian Shi' in GoogleThis author has not been identified. Look up 'Chanmin Su' in Google

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