Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero. Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data. In Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos, editors, 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, September 12-14, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{BellarminoCHKSS22,
title = {Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data},
author = {Nicolò Bellarmino and Riccardo Cantoro and Martin Huch and Tobias Kilian and Ulf Schlichtmann and Giovanni Squillero},
year = {2022},
doi = {10.1109/IOLTS56730.2022.9897769},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897769},
researchr = {https://researchr.org/publication/BellarminoCHKSS22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, September 12-14, 2022},
editor = {Alessandro Savino and Paolo Rech and Stefano Di Carlo and Dimitris Gizopoulos},
publisher = {IEEE},
isbn = {978-1-6654-7355-2},
}