Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero. Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data. In Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos, editors, 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, September 12-14, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.