Scan Cell Ordering for Low Power BIST - researchr publication authors

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Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos. Scan Cell Ordering for Low Power BIST. In 2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), Emerging Trends in VLSI Systems Design, 19-20 February 2004, Lafayette, LA, USA. pages 281-284, IEEE Computer Society, 2004. [doi]

This author has not been identified. Look up 'Maciej Bellos' in GoogleThis author has not been identified. Look up 'Dimitris Bakalis' in GoogleThis author has not been identified. Look up 'Dimitris Nikolos' in Google

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