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Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature

Yassine Belmehdi, Stephane Azzopardi, Jean-Yves Deletage, Eric Woirgard. Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature. Microelectronics Reliability, 50(9-11):1815-1821, 2010. [doi]

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Yassine Belmehdi

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Stephane Azzopardi

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Jean-Yves Deletage

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Eric Woirgard

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