Emil Benedykciuk, Marcin Denkowski, Krzysztof Dmitruk. Learning-based Material Classification in X-ray Security Images. In Giovanni Maria Farinella, Petia Radeva, José Braz, editors, Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2020, Volume 4: VISAPP, Valletta, Malta, February 27-29, 2020. pages 284-291, SCITEPRESS, 2020. [doi]
Abstract is missing.