Optimal production test times through adaptive test programming

Scott Benner, Oluseyi Boroffice. Optimal production test times through adaptive test programming. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 908-915, IEEE Computer Society, 2001.

Authors

Scott Benner

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Oluseyi Boroffice

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