Kwabena Ebo Bennin, Koji Toda, Yasutaka Kamei, Jacky Keung, Akito Monden, Naoyasu Ubayashi. Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models. In 2016 IEEE International Conference on Software Quality, Reliability and Security, QRS 2016, Vienna, Austria, August 1-3, 2016. pages 214-221, IEEE, 2016. [doi]
@inproceedings{BenninTKKMU16,
title = {Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models},
author = {Kwabena Ebo Bennin and Koji Toda and Yasutaka Kamei and Jacky Keung and Akito Monden and Naoyasu Ubayashi},
year = {2016},
doi = {10.1109/QRS.2016.33},
url = {http://dx.doi.org/10.1109/QRS.2016.33},
researchr = {https://researchr.org/publication/BenninTKKMU16},
cites = {0},
citedby = {0},
pages = {214-221},
booktitle = {2016 IEEE International Conference on Software Quality, Reliability and Security, QRS 2016, Vienna, Austria, August 1-3, 2016},
publisher = {IEEE},
isbn = {978-1-5090-4127-5},
}