Tristan Benoit, Jean-Yves Marion, Sébastien Bardin. Binary level toolchain provenance identification with graph neural networks. In 28th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2021, Honolulu, HI, USA, March 9-12, 2021. pages 131-141, IEEE, 2021. [doi]
Abstract is missing.