Efficient minimization of test frequencies for linear analog circuits

Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir. Efficient minimization of test frequencies for linear analog circuits. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1, IEEE Computer Society, 2013. [doi]

Abstract

Abstract is missing.