An ANFIS-based Computation to Study the Degradation-related Ageing effects in Nanoscale GAA-TFETs - researchr publication authors

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Toufik Bentrcia, Fayçal Djeffal, Hichem Ferhati. An ANFIS-based Computation to Study the Degradation-related Ageing effects in Nanoscale GAA-TFETs. In Mohamed Ridda Laouar, Antonio Capodieci, editors, ICIST '20: 10th International Conference on Information Systems and Technologies, Lecce, Italy, 4-5June, 2020. ACM, 2020. [doi]

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