A. Benvegnù, Sylvain Laurent, Matteo Meneghini, Raymond Quéré, J. L. Roux, Enrico Zanoni, D. Barataud. Continuous time-domain RF waveforms monitoring under overdrive stress condition of AlGaN/GaN HEMTs. Microelectronics Reliability, 64:535-540, 2016. [doi]
Abstract is missing.