Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski. Impact of Multiple-Detect Test Patterns on Product Quality. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1031-1040, IEEE Computer Society, 2003. [doi]
@inproceedings{BenwareSRMKTTR03,
title = {Impact of Multiple-Detect Test Patterns on Product Quality},
author = {Brady Benware and Chris Schuermyer and Sreenevasan Ranganathan and Robert Madge and Prabhu Krishnamurthy and Nagesh Tamarapalli and Kun-Han Tsai and Janusz Rajski},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631031abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/BenwareSRMKTTR03},
cites = {0},
citedby = {0},
pages = {1031-1040},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}