Robert Madge - researchr alias

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Viewing Publication 1 - 24 from 24

2007

Making Manufacturing Work For YouSrikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian. dac 2007: 107-108 [doi]

2005

Data-driven models for statistical testing: measurements, estimates and residualsW. Robert Daasch, Robert Madge. itc 2005: 10 [doi]

Variance reduction and outliers: statistical analysis of semiconductor test dataW. Robert Daasch, Robert Madge. itc 2005: 9 [doi]

New test paradigms for yield and manufacturabilityRobert Madge. dt, 22(3):240-246, 2005. [doi]

The value of statistical testing for quality, yield and test cost improvementRobert Madge, Brady Benware, Mark Ward, W. Robert Daasch. itc 2005: 10 [doi]

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysisChris Schuermyer, Kevin Cota, Robert Madge, Brady Benware. itc 2005: 9 [doi]

Defect Screening Using Independent Component Analysis on I_DDQRitesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch. vts 2005: 427-432 [doi]

2004

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault ModelBrady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski. itc 2003: 1285-1294 [doi]

Detection of Temperature Sensitive Defects Using ZTCEthan Long, W. Robert Daasch, Robert Madge, Brady Benware. vts 2004: 185-192 [doi]

ATE Value Add through Open Data CollectionRobert Madge. itc 2003: 1430 [doi]

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test CostRobert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler. itc 2003: 203-212 [doi]

New Test Paradigms for Yield and ManufacturabilityRobert Madge. itc 2003: 13 [doi]

ATE Data Collection - A comprehensive requirements proposal to maximize ROI of testManu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw. itc 2003: 181-189 [doi]

2003

Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICsBrady Benware, Robert Madge, Cam Lu, W. Robert Daasch. vts 2003: 39-46 [doi]

Impact of Multiple-Detect Test Patterns on Product QualityBrady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski. itc 2003: 1031-1040 [doi]

Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICsRobert Madge, Brady Benware, W. Robert Daasch. dt, 20(5):46-53, 2003. [doi]

Creating Value Through TestErik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Müller. date 2003: 10402-10409 [doi]

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQChris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning. itc 2003: 565-573 [doi]

2002

Neighbor Selection for Variance Reduction in IDDQ and Other Parametric DataW. Robert Daasch, Kevin Cota, James McNames, Robert Madge. itc 2002: 1240 [doi]

Neighborhood Selection for IDDQ Outlier Screening at Wafer SortW. Robert Daasch, James McNames, Robert Madge, Kevin Cota. dt, 19(5):74-81, 2002. [doi]

Screening MinVDD Outliers Using Feed-Forward Voltage TestingRobert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner. itc 2002: 673-682 [doi]

Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron TechnologiesRobert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch. vts 2002: 69-74 [doi]

Isolating and Removing Sources of Variation in Test DataDavid Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge. itc 2002: 464-471 [doi]

2001

Neighbor selection for variance reduction in I_DDQ and other parametric dataW. Robert Daasch, Kevin Cota, James McNames, Robert Madge. itc 2001: 92-100

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2001

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