Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch. Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 69-74, IEEE Computer Society, 2002. [doi]
Abstract is missing.