Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski. Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1285-1294, IEEE, 2004. [doi]
Abstract is missing.