Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski. Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1285-1294, IEEE, 2004. [doi]
@inproceedings{BenwareLSKMKKR04,
title = {Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model},
author = {Brady Benware and Cam Lu and John Van Slyke and Prabhu Krishnamurthy and Robert Madge and Martin Keim and Mark Kassab and Janusz Rajski},
year = {2004},
doi = {10.1109/ITC.2004.26},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.26},
researchr = {https://researchr.org/publication/BenwareLSKMKKR04},
cites = {0},
citedby = {0},
pages = {1285-1294},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}