Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning. Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 565-573, IEEE Computer Society, 2003. [doi]
Abstract is missing.