Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch. Defect Screening Using Independent Component Analysis on I_DDQ. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 427-432, IEEE Computer Society, 2005. [doi]
Abstract is missing.