Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch. Defect Screening Using Independent Component Analysis on I_DDQ. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 427-432, IEEE Computer Society, 2005. [doi]
@inproceedings{TurakhiaBMSD05,
title = {Defect Screening Using Independent Component Analysis on I_DDQ},
author = {Ritesh P. Turakhia and Brady Benware and Robert Madge and Thaddeus T. Shannon and W. Robert Daasch},
year = {2005},
doi = {10.1109/VTS.2005.38},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.38},
tags = {analysis},
researchr = {https://researchr.org/publication/TurakhiaBMSD05},
cites = {0},
citedby = {0},
pages = {427-432},
booktitle = {23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2314-5},
}