Application of the Josephson effect to voltage metrology

Samuel P. Benz, Clark A. Hamilton. Application of the Josephson effect to voltage metrology. Proceedings of the IEEE, 92(10):1617-1629, 2004. [doi]

@article{BenzH04,
  title = {Application of the Josephson effect to voltage metrology},
  author = {Samuel P. Benz and Clark A. Hamilton},
  year = {2004},
  doi = {10.1109/JPROC.2004.833671},
  url = {https://doi.org/10.1109/JPROC.2004.833671},
  researchr = {https://researchr.org/publication/BenzH04},
  cites = {0},
  citedby = {0},
  journal = {Proceedings of the IEEE},
  volume = {92},
  number = {10},
  pages = {1617-1629},
}