Application of Pinching Method to Quantify Sensitivity of Reactivity Coefficients on Power Defect

Subrata Bera. Application of Pinching Method to Quantify Sensitivity of Reactivity Coefficients on Power Defect. In Zhongzhi Shi, Mihir K. Chakraborty, Samarjit Kar, editors, Intelligence Science III: 4th IFIP TC 12 International Conference, ICIS 2020, Durgapur, India, February 24-27, 2021, Revised Selected Papers. Volume 623 of IFIP Advances in Information and Communication Technology, pages 263-272, Springer International Publishing, 2020. [doi]

Abstract

Abstract is missing.