Robbert van den Berg, Boris Skoric, Vincent van der Leest. Bias-based modeling and entropy analysis of PUFs. In Ahmad-Reza Sadeghi, Frederik Armknecht, Jean-Pierre Seifert, editors, TrustED'13, Proceedings of the 2013 ACM Workshop on Trustworthy Embedded Devices, Co-located with CCS 2013, November 4, 2013, Berlin, Germany. pages 13-20, ACM, 2013. [doi]
@inproceedings{BergSL13-0, title = {Bias-based modeling and entropy analysis of PUFs}, author = {Robbert van den Berg and Boris Skoric and Vincent van der Leest}, year = {2013}, doi = {10.1145/2517300.2517301}, url = {http://doi.acm.org/10.1145/2517300.2517301}, researchr = {https://researchr.org/publication/BergSL13-0}, cites = {0}, citedby = {0}, pages = {13-20}, booktitle = {TrustED'13, Proceedings of the 2013 ACM Workshop on Trustworthy Embedded Devices, Co-located with CCS 2013, November 4, 2013, Berlin, Germany}, editor = {Ahmad-Reza Sadeghi and Frederik Armknecht and Jean-Pierre Seifert}, publisher = {ACM}, isbn = {978-1-4503-2486-1}, }