Robbert van den Berg, Boris Skoric, Vincent van der Leest. Bias-based modeling and entropy analysis of PUFs. In Ahmad-Reza Sadeghi, Frederik Armknecht, Jean-Pierre Seifert, editors, TrustED'13, Proceedings of the 2013 ACM Workshop on Trustworthy Embedded Devices, Co-located with CCS 2013, November 4, 2013, Berlin, Germany. pages 13-20, ACM, 2013. [doi]
Abstract is missing.