Robert Berger, Dennis Rathman, Brian Tyrrell, E. J. Kohler, Michael K. Rose, R. Allen Murphy, Theodore S. Perry, Harry F. Robey, Franz A. Weber, David M. Craig, Antonio M. Soares, Stephen P. Vernon, Robert K. Reich. A 64×64-Pixel CMOS Test Chip for the Development of Large-Format Ultra-High-Speed Snapshot Imagers. J. Solid-State Circuits, 43(9):1940-1950, 2008. [doi]
@article{BergerRTKRMPRWC08,
title = {A 64×64-Pixel CMOS Test Chip for the Development of Large-Format Ultra-High-Speed Snapshot Imagers},
author = {Robert Berger and Dennis Rathman and Brian Tyrrell and E. J. Kohler and Michael K. Rose and R. Allen Murphy and Theodore S. Perry and Harry F. Robey and Franz A. Weber and David M. Craig and Antonio M. Soares and Stephen P. Vernon and Robert K. Reich},
year = {2008},
doi = {10.1109/JSSC.2008.2001912},
url = {https://doi.org/10.1109/JSSC.2008.2001912},
researchr = {https://researchr.org/publication/BergerRTKRMPRWC08},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {43},
number = {9},
pages = {1940-1950},
}