Jules P. Bergmann, Mark Horowitz. Improving coverage analysis and test generation for large designs. In Jacob K. White, Ellen Sentovich, editors, Proceedings of the 1999 IEEE/ACM International Conference on Computer-Aided Design, 1999, San Jose, California, USA, November 7-11, 1999. pages 580-583, IEEE, 1999. [doi]
@inproceedings{BergmannH99, title = {Improving coverage analysis and test generation for large designs}, author = {Jules P. Bergmann and Mark Horowitz}, year = {1999}, url = {http://portal.acm.org/citation.cfm?id=339492.340080}, tags = {test coverage, testing, analysis, coverage}, researchr = {https://researchr.org/publication/BergmannH99}, cites = {0}, citedby = {0}, pages = {580-583}, booktitle = {Proceedings of the 1999 IEEE/ACM International Conference on Computer-Aided Design, 1999, San Jose, California, USA, November 7-11, 1999}, editor = {Jacob K. White and Ellen Sentovich}, publisher = {IEEE}, isbn = {0-7803-5832-5}, }