Berta Bernad, Alejandro Ferrero, Alicia Pons, M. Luisa Hernanz, Joaquín Campos Acosta. Upgrade of goniospectrophtometer GEFE for near-field scattering and fluorescence radiance measurements. In Maria V. Ortiz Segovia, Philipp Urban, Francisco H. Imai, editors, Measuring, Modeling, and Reproducing Material Appearance 2015, San Francisco, California, United States, February 9-10, 2015. Volume 9398 of SPIE Proceedings, SPIE, 2015. [doi]
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