Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre. Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. In Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek, editors, 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. pages 21-26, IEEE, 2023. [doi]
@inproceedings{BernardiFRABT23,
title = {Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults},
author = {Paolo Bernardi and Gabriele Filipponi and Matteo Sonza Reorda and Davide Appello and Claudia Bertani and Vincenzo Tancorre},
year = {2023},
doi = {10.1109/DDECS57882.2023.10139670},
url = {https://doi.org/10.1109/DDECS57882.2023.10139670},
researchr = {https://researchr.org/publication/BernardiFRABT23},
cites = {0},
citedby = {0},
pages = {21-26},
booktitle = {26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023},
editor = {Maksim Jenihhin and Hana Kubátová and Nele Metens and Jaan Raik and Foisal Ahmed and Jan Belohoubek},
publisher = {IEEE},
isbn = {979-8-3503-3277-3},
}