A Metric for the Measurement of Relative Susceptibility to Training Data Noise for Multi-Layer Perceptrons - researchr publication

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Jonathan P. Bernick. A Metric for the Measurement of Relative Susceptibility to Training Data Noise for Multi-Layer Perceptrons. In Hamid R. Arabnia, Elena B. Kozerenko, editors, Proceedings of the International Conference on Machine Learning; Models, Technologies and Applications. MLMTA 03, June 23 - 26, 2003, Las Vegas, Nevada, USA. pages 298-301, CSREA Press, 2003.

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