Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization - researchr publication

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Andrea Bernieri, Giovanni Betta, Luigi Ferrigno, Marco Laracca, Stefano Mastrostefano. Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization. IEEE T. Instrumentation and Measurement, 63(5):1272-1280, 2014. [doi]

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