Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electronic Testing, 17(5):439-450, 2001. [doi]
@article{BeroulleBLN01:0,
title = {Test and Testability of a Monolithic MEMS for Magnetic Field Sensing},
author = {Vincent Beroulle and Yves Bertrand and Laurent Latorre and Pascal Nouet},
year = {2001},
doi = {10.1023/A:1012759320563},
url = {http://dx.doi.org/10.1023/A:1012759320563},
tags = {testing, Pascal},
researchr = {https://researchr.org/publication/BeroulleBLN01%3A0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {5},
pages = {439-450},
}