Laser-Induced Fault Effects in Security-Dedicated Circuits - researchr publication authors

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Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clement Tavernier, Pierre Vanhauwaert. Laser-Induced Fault Effects in Security-Dedicated Circuits. In Luc Claesen, María Teresa Sanz-Pascual, Ricardo Reis, Arturo Sarmiento-Reyes, editors, VLSI-SoC: Internet of Things Foundations - 22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2014, Playa del Carmen, Mexico, October 6-8, 2014, Revised and Extended Selected Papers. Volume 464 of IFIP Advances in Information and Communication Technology, pages 220-240, Springer, 2014. [doi]

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