Laser-Induced Fault Effects in Security-Dedicated Circuits

Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clement Tavernier, Pierre Vanhauwaert. Laser-Induced Fault Effects in Security-Dedicated Circuits. In Luc Claesen, María Teresa Sanz-Pascual, Ricardo Reis, Arturo Sarmiento-Reyes, editors, VLSI-SoC: Internet of Things Foundations - 22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2014, Playa del Carmen, Mexico, October 6-8, 2014, Revised and Extended Selected Papers. Volume 464 of IFIP Advances in Information and Communication Technology, pages 220-240, Springer, 2014. [doi]

@inproceedings{BeroulleCCNDFHH14,
  title = {Laser-Induced Fault Effects in Security-Dedicated Circuits},
  author = {Vincent Beroulle and Philippe Candelier and Stephan De Castro and Giorgio Di Natale and Jean-Max Dutertre and Marie-Lise Flottes and David Hély and Guillaume Hubert and Régis Leveugle and Feng Lu and Paolo Maistri and Athanasios Papadimitriou and Bruno Rouzeyre and Clement Tavernier and Pierre Vanhauwaert},
  year = {2014},
  doi = {10.1007/978-3-319-25279-7_12},
  url = {http://dx.doi.org/10.1007/978-3-319-25279-7_12},
  researchr = {https://researchr.org/publication/BeroulleCCNDFHH14},
  cites = {0},
  citedby = {0},
  pages = {220-240},
  booktitle = {VLSI-SoC: Internet of Things Foundations - 22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2014, Playa del Carmen, Mexico, October 6-8, 2014, Revised and Extended Selected Papers},
  editor = {Luc Claesen and María Teresa Sanz-Pascual and Ricardo Reis and Arturo Sarmiento-Reyes},
  volume = {464},
  series = {IFIP Advances in Information and Communication Technology},
  publisher = {Springer},
  isbn = {978-3-319-25278-0},
}