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Connecting RRAM performance to the properties of the hafnia-based dielectrics

Gennadi Bersuker, Brian Butcher, David Gilmer, Paul Kirsch, Luca Larcher, Andrea Padovani. Connecting RRAM performance to the properties of the hafnia-based dielectrics. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 163-165, IEEE, 2013. [doi]

Authors

Gennadi Bersuker

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Brian Butcher

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David Gilmer

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Paul Kirsch

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Luca Larcher

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Andrea Padovani

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