Gennadi Bersuker, Brian Butcher, David Gilmer, Paul Kirsch, Luca Larcher, Andrea Padovani. Connecting RRAM performance to the properties of the hafnia-based dielectrics. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 163-165, IEEE, 2013. [doi]
Abstract is missing.