Panel: When will the cost of dependability end innovation in computer design?

Valeria Bertacco. Panel: When will the cost of dependability end innovation in computer design?. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1, IEEE, 2015. [doi]

Authors

Valeria Bertacco

This author has not been identified. Look up 'Valeria Bertacco' in Google