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David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre. BISTing Datapaths under Heterogeneous Test Schemes. J. Electronic Testing, 14(1-2):115-123, 1999. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST SynthesisDavid Berthelot, Marie-Lise Flottes, Bruno Rouzeyre. et, 17(3-4):331-339, 2001. [doi]
The following publications are possibly variants of this publication: