Voltage Noise in Multi-Core Processors: Empirical Characterization and Optimization Opportunities - researchr publication authors

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Ramon Bertran, Alper Buyuktosunoglu, Pradip Bose, Timothy J. Slegel, Gerard Salem, Sean M. Carey, Richard F. Rizzolo, Thomas Strach. Voltage Noise in Multi-Core Processors: Empirical Characterization and Optimization Opportunities. In 47th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2014, Cambridge, United Kingdom, December 13-17, 2014. pages 368-380, IEEE, 2014. [doi]

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