Inter-turn short-circuit fault model for magnetically coupled circuits: A general study

A. Berzoy, A. A. S. Mohamed, O. A. Mohammed. Inter-turn short-circuit fault model for magnetically coupled circuits: A general study. In 2016 IEEE Industry Applications Society Annual Meeting, Portland, OR, USA, October 2-6, 2016. pages 1-7, IEEE, 2016. [doi]

Authors

A. Berzoy

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A. A. S. Mohamed

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O. A. Mohammed

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