Inter-turn short-circuit fault model for magnetically coupled circuits: A general study

A. Berzoy, A. A. S. Mohamed, O. A. Mohammed. Inter-turn short-circuit fault model for magnetically coupled circuits: A general study. In 2016 IEEE Industry Applications Society Annual Meeting, Portland, OR, USA, October 2-6, 2016. pages 1-7, IEEE, 2016. [doi]

@inproceedings{BerzoyMM16,
  title = {Inter-turn short-circuit fault model for magnetically coupled circuits: A general study},
  author = {A. Berzoy and A. A. S. Mohamed and O. A. Mohammed},
  year = {2016},
  doi = {10.1109/IAS.2016.7731866},
  url = {http://dx.doi.org/10.1109/IAS.2016.7731866},
  researchr = {https://researchr.org/publication/BerzoyMM16},
  cites = {0},
  citedby = {0},
  pages = {1-7},
  booktitle = {2016 IEEE Industry Applications Society Annual Meeting, Portland, OR, USA, October 2-6, 2016},
  publisher = {IEEE},
  isbn = {978-1-4799-8397-1},
}