Performance and reliability of strained SOI transistors for advanced planar FDSOI technology

G. Besnard, Xavier Garros, A. Subirats, Fran├žois Andrieu, X. Federspiel, M. Rafik, W. Schwarzenbach, Gilles Reimbold, Olivier Faynot, Sorin Cristoloveanu. Performance and reliability of strained SOI transistors for advanced planar FDSOI technology. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]

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