Matthias Beste, Mehdi Baradaran Tahoori. Layout-Driven Robustness Analysis for misaligned Carbon Nanotubes in CNTFET-based standard cells. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 1609-1614, IEEE, 2012. [doi]
Abstract is missing.