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Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror

C. Bestory, F. Marc, S. Duzellier, H. Levi. Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. Microelectronics Reliability, 49(9-11):946-951, 2009. [doi]

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