Sami Beydeda, Volker Gruhn. Integrating White- and Black-Box Techniques for Class-Level Regression Testing. In 25th International Computer Software and Applications Conference (COMPSAC 2001), Invigorating Software Development, 8-12 October 2001, Chicago, IL, USA. pages 357-362, IEEE Computer Society, 2001. [doi]
@inproceedings{BeydedaG01,
title = {Integrating White- and Black-Box Techniques for Class-Level Regression Testing},
author = {Sami Beydeda and Volker Gruhn},
year = {2001},
doi = {10.1109/CMPSAC.2001.960639},
url = {http://doi.ieeecomputersociety.org/10.1109/CMPSAC.2001.960639},
tags = {testing},
researchr = {https://researchr.org/publication/BeydedaG01},
cites = {0},
citedby = {0},
pages = {357-362},
booktitle = {25th International Computer Software and Applications Conference (COMPSAC 2001), Invigorating Software Development, 8-12 October 2001, Chicago, IL, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1372-7},
}